Journal of Materials Science

, Volume 30, Issue 13, pp 3346–3350 | Cite as

Infrared absorption in thick film resistors

  • B. UluĞ
  • A. UluĞ
  • E. Şener


Infrared absorption in polymer and glass-based thick film resistors has been measured between 400 and 1500 cm−1. Sample structures are discussed on the basis of X-ray, Fourier transform-infrared and resistance-temperature data. It is shown that in polymer-based thick film resistors, the particulate phase is mostly responsible for the infrared absorption between 400 and 900 cm−1, whereas the infrared absorption at higher wave numbers is related to the continuous phase. In glass-based thick film resistors, absorption is mostly determined by the highly doped glass. The results indicate that thick film resistors can be used as an absorbent coating in the 400–1500 cm−1 region by suitable selection of the continuous and particulate phases.


Polymer Fourier Material Processing Thick Film Particulate Phase 
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  1. 1.
    F. FORLANI, Thin solid Films 36 (1976) 313.CrossRefGoogle Scholar
  2. 2.
    G. E. PIKE and C. H. SEAGER, J. Appl. Phys. 48 (1977) 5152.CrossRefGoogle Scholar
  3. 3.
    M. PRUDENZIATI, in “Proceedings of the 3rd European ISHM Conference”, Avignon, May 1981, p. 1Google Scholar
  4. 4.
    J. ROBERTSON, Electrocomp. Sci. Technol. 4 (1977) 105.CrossRefGoogle Scholar
  5. 5.
    B. ULUĞ, Doğa Turkish J. Phys. Astrophys. 10 (1) (1985) 33.Google Scholar
  6. 6.
    P. J. DEAN, Rev. Mod. Phys. 44 (1972) 142.CrossRefGoogle Scholar
  7. 7.
    D. STAUFFER, Phys. Rep. 54 (1979) 1.CrossRefGoogle Scholar
  8. 8.
    Y. YAGIL, M. YOSEFIN, D. J. BERGMAN and G. DEUTSCHER, Phys. Rev. B43 (11) (1991) 342.Google Scholar
  9. 9.
    T. W. NOH, P. H. SONG, S. I. LEE, D.C. HARRIS, J. R. GAINES and J. C. GARLAND, ibid. B46 (7) (1992) 4212.CrossRefGoogle Scholar
  10. 10.
    T. W. NOH, S. I. LEE and J. R. GAINES, ibid. B33 (1986) 1401.CrossRefGoogle Scholar
  11. 11.
    W. KRATSCHMER, L. D. LAMB, K. FOSTIROPOULOS and D. R. HUFFMAN Nature 347 (1990) 354.CrossRefGoogle Scholar
  12. 12.
    G. A. SAMARA, J. E. SCHIRBER, B. MOROSIN, L. V. HANSEN, D. LOY and A. P. SYLWESTER Phys. Rev. Lett. 67 (1991) 3136.CrossRefGoogle Scholar

Copyright information

© Chapman & Hall 1995

Authors and Affiliations

  • B. UluĞ
    • 1
  • A. UluĞ
    • 1
  • E. Şener
    • 1
    • 2
  1. 1.Department of Physics, Faculty of Arts and SciencesInönü UniversityMalatyaTurkey
  2. 2.Department of Chemistry, Faculty of Arts and SciencesInönü UniversityMalatyaTurkey

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