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SIMS investigations of ion beam induced PVK fragmentation

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Summary

The mass spectra of secondary ions emitted from PVK thin layers under 2 keV Xe+ bombardment were measured. The charasteristic elemental and molecular ions emitted were specified. The temperature dependence of the secondary emission was also measured. The results obtained were briefly discussed in terms of the ion beam-induced polymer structure fragmentation.

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References

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Work supported by the research programme MR-I-5-8.

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Starzyk, F., Barbaszewski, T. SIMS investigations of ion beam induced PVK fragmentation. Polymer Bulletin 14, 361–366 (1985). https://doi.org/10.1007/BF00254961

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Keywords

  • Polymer
  • Mass Spectrum
  • Thin Layer
  • Material Processing
  • Structure Fragmentation