Abstract
Atomic force microscopy, also referred to as scanning force microscopy, is obviously not a technique based on electron microscopy. However, it has been common practice in the last few years to supplement electron microscopy with atomic force microscopy, as the latter enables the straightforward surface characterisation of polymers and provides additional insight into the structure and properties of homopolymers, blends and composites. Therefore, a brief survey of the fundamentals and relevant applications of this technique to polymer research is presented in this chapter. Because of its special importance for polymer investigations, tappingmode atomic force microscopy will be described in detail, while other modes of operation will be introduced more briefly.
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(2008). Atomic Force Microscopy. In: Electron Microscopy of Polymers. Springer Laboratory. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-36352-1_6
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DOI: https://doi.org/10.1007/978-3-540-36352-1_6
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-540-36350-7
Online ISBN: 978-3-540-36352-1
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