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IAENG Transactions on Engineering Technologies pp 297–308Cite as

Distribution of the Distance Between Receptors of Ordered Micropatterned Substrates

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Part of the book series: Lecture Notes in Electrical Engineering ((LNEE,volume 170))

Abstract

We study the statistics of equally spaced pairs of receptors on a family of ordered flat microsubstrates whose adhesive centers form regular tessellations. We establish relationship between the symmetry of substrates and the probability density of the end-to-end polymer separation in terms of the so-called Manhattan distance.

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Author information

Authors and Affiliations

  1. Institute of Mathematics, Czestochowa University of Technology, Dabrowskiego 69, 42-201, Czestochowa, Poland

    Zbigniew Domański

  2. Institute of Computer and Information Sciences, Czestochowa University of Technology, Dabrowskiego 69, 42-201, Czestochowa, Poland

    Norbert Sczygiol

Authors
  1. Zbigniew Domański
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  2. Norbert Sczygiol
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Corresponding author

Correspondence to Zbigniew Domański .

Editor information

Editors and Affiliations

  1. Engineering College, Computer & Communication, Catholic University of DaeGu, Dean of Engineering College, DaeGu, 712702, Korea, Republic of (South Korea)

    Haeng Kon Kim

  2. , Unit 1, 1/F, International Association of Engineers, Hung To Road, Hong Kong, 37-39, Hong Kong SAR

    Sio-Iong Ao

  3. FB II Linguistische Datenverarbeitung, Computerlinguistik, Universität Trier, Universitätsring 15, Trier, 54286, Germany

    Burghard B. Rieger

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Domański, Z., Sczygiol, N. (2013). Distribution of the Distance Between Receptors of Ordered Micropatterned Substrates. In: Kim, H., Ao, SI., Rieger, B. (eds) IAENG Transactions on Engineering Technologies. Lecture Notes in Electrical Engineering, vol 170. Springer, Dordrecht. https://doi.org/10.1007/978-94-007-4786-9_24

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  • DOI: https://doi.org/10.1007/978-94-007-4786-9_24

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  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-94-007-4785-2

  • Online ISBN: 978-94-007-4786-9

  • eBook Packages: EngineeringEngineering (R0)

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