Abstract
X-Ray Absorption Spectroscopy (XAS) is a well-established analytical technique used extensively for the characterization of semiconductors in solid or liquid, crystalline or amorphous, bulk or nanoscale form. With this chapter, we provide a brief introduction to XAS, covering both theory and experiment, while we refer to more comprehensive texts for greater detail about this continually evolving technique. The chapter thus is a starting point upon which subsequent chapters build as they demonstrate the broad-ranging applications of XAS to semiconductors materials.
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Notes
- 1.
The analog of the Schrödinger equation for excited states.
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Schnohr, C.S., Ridgway, M.C. (2015). Introduction to X-Ray Absorption Spectroscopy. In: Schnohr, C., Ridgway, M. (eds) X-Ray Absorption Spectroscopy of Semiconductors. Springer Series in Optical Sciences, vol 190. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-44362-0_1
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