Skip to main content

Problems Associated with the Electron Microscopy of Polymers

  • Chapter
Book cover Electron Microscopy of Polymers

Part of the book series: Springer Laboratory ((SPLABORATORY))

Abstract

This introductory chapter to Part II –which dealswith preparation techniques – summarises the main problems associated with the investigation of polymers by electron microscopy. The irradiation sensitivity of polymers can be reduced by taking precautions with the instrumentation and the manner of operation. It should also be noted that the irradiation sensitivity of polymers can be utilised for special contrast development effects. The problem of the low contrast between structural details of polymers can be overcome through the use of chemical staining, physical effects or surface etching. The third problem is the preparation of ultrathin specimens from bulk polymers, which is successfully solved by applying (cryo)ultramicrotomy. Some additional methods are mentioned, and the applicabilities of various methods for studying themorphologies of several classes of polymers are summarized.All of these methods are described in detail in subsequent chapters in Part II.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 84.99
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 109.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book
USD 109.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. Grubb DT (1974) J Mater Sci 9:1715

    Article  CAS  Google Scholar 

  2. Reimer L (1975) Review of the radiation damage problem of organic specimens. In: Siegel BM, Beaman DR (eds) Electron microscopy. Wiley, New York, p 231

    Google Scholar 

  3. Glaeser RM (1975) Radiation damage and biological electron microscopy. In: Siegel BM, Beanan DR (eds) Electron microscopy. Wiley, New York, p 205

    Google Scholar 

  4. Misell DL (ed) (1977) Developments in electron microscopy and analysis (Conf Ser 36). Institute of Physics, Bristol, UK

    Google Scholar 

  5. Michler GH (1993) Appl Spectrosc Rev 28:327

    Article  CAS  Google Scholar 

  6. Fischer EW (1976) Proc 4th Int Conf Phys Non-Cryst Solids, Clausthal-Zellerfeld, Germany, 13–17 Sept 1976, p 34

    Google Scholar 

  7. Baier P et al. (1980) Proc 7th Eur Congr Electron Microscopy, Vol 2, The Hague, The Netherlands, 24–30 Aug 1980, p 638

    Google Scholar 

  8. Dubochet J, Knapek E, Dietrich I (1981) Ultramicroscopy 6:77

    Article  CAS  Google Scholar 

  9. Fryer JR, Holland F (1983) Ultramicroscopy 11:67

    Article  CAS  Google Scholar 

  10. Boudet A, Kubin LP (1978) Proc 9th Int Congr Electron Microscopy, Vol 1, Toronto, Canada, 1–9 Aug 1978, p 498

    Google Scholar 

  11. Parsons DF, Marko M, King MV (1980) J Microsc 118:127

    CAS  Google Scholar 

  12. Thomas EL, Humphreys, CJ, Duff WR, Grubb DT (1970) Radiat Effects 3:89

    Article  CAS  Google Scholar 

  13. Thomas EL, Ast DG (1974) Polymer 15:37

    Article  CAS  Google Scholar 

  14. Martinez JP et al. (1982) Ultramicroscopy 8:437

    Article  CAS  Google Scholar 

  15. Michler GH, Dietzsch Ch (1982) Cryst Res Technol 17:1241

    Article  CAS  Google Scholar 

  16. Krause SJ, Allard LF, Bigelow WC (1978) Proc 9th Int Congr Electron Microscopy, Vol 1, Toronto, Canada, 1–9 Aug 1978, p 496

    Google Scholar 

  17. Glaeser RM, Taylor KA (1978) J Microsc 112:127

    CAS  Google Scholar 

  18. Dorset DL, Zemlin F (1985) Ultramicroscopy 17:229

    Article  CAS  Google Scholar 

Download references

Rights and permissions

Reprints and permissions

Copyright information

© 2008 Springer-Verlag Berlin Heidelberg

About this chapter

Cite this chapter

(2008). Problems Associated with the Electron Microscopy of Polymers. In: Electron Microscopy of Polymers. Springer Laboratory. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-36352-1_9

Download citation

Publish with us

Policies and ethics