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Nano-Thermomechanics: Fundamentals and Application in Data Storage Devices

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Applied Scanning Probe Methods IV

Part of the book series: NanoScience and Technology ((NANO))

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Author information

Authors and Affiliations

  1. Zurich Research Laboratory, IBM Research GmbH, Säumerstrasse 4, CH-8803, Rüschlikon, Switzerland

    B. Gotsmann & U. Dürig

Authors
  1. B. Gotsmann
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  2. U. Dürig
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Editor information

Editors and Affiliations

  1. Nanotribology Laboratory for Information Storage and MEMS/NEMS (NLIM), The Ohio State University, 650 Ackerman Road, Suite 255, Columbus, OH, 43202-1107, USA

    Bharat Bhushan

  2. Center for Nanotechnology (CeNTech) and Institute of Physics, University of Münster, Gievenbecker Weg 11, 48149, Münster, Germany

    Harald Fuchs

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© 2006 Springer-Verlag Berlin Heidelberg

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Gotsmann, B., Dürig, U. (2006). Nano-Thermomechanics: Fundamentals and Application in Data Storage Devices. In: Bhushan, B., Fuchs, H. (eds) Applied Scanning Probe Methods IV. NanoScience and Technology. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-26914-2_7

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