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An analysis of the radiation behavior of pulse voltage stabilizers

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Abstract

A typical structure of modern hybrid microcircuits of pulse voltage stabilizers (PVSs) is analyzed. Experiential studies of dose and single-event local ionization effects in basic units of modern pulse voltage stabilizers are performed. The model of pulse voltage stabilizers for analyzing single-event effects is proposed, and its experimental verification is fulfilled. The most radiation-sensitive basic units of pulse voltage stabilizers are revealed. Recommendations for increasing their radiation resistance are given.

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Authors and Affiliations

  1. Specialized Electronic Systems (SPELS), Moscow, Russia

    L. N. Kessarinskiy, D. V. Boychenko & A. Y. Nikiforov

  2. National Research Nuclear University MEPhI, Moscow, Russia

    L. N. Kessarinskiy, D. V. Boychenko & A. Y. Nikiforov

Authors
  1. L. N. Kessarinskiy
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  2. D. V. Boychenko
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  3. A. Y. Nikiforov
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Corresponding author

Correspondence to L. N. Kessarinskiy.

Additional information

Original Russian Text © L.N. Kessarinskiy, D.V. Boychenko, A.Y. Nikiforov, 2012, published in Mikroelektronika, 2012, Vol. 41, No. 4, pp. 275–283.

This work was performed by SPELS and the Institute of Extremal Applied Electronics of the National Research Nuclear University MEPhI under State Contract no. 13.G36.31.007 of October 22, 2010 with the Ministry of Education and Science of the Russian Federation.

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Kessarinskiy, L.N., Boychenko, D.V. & Nikiforov, A.Y. An analysis of the radiation behavior of pulse voltage stabilizers. Russ Microelectron 41, 251–258 (2012). https://doi.org/10.1134/S1063739712040075

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  • DOI: https://doi.org/10.1134/S1063739712040075

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